SMART Werte für Festplatte interpretieren

Ich habe keinerlei Erfahrung mit S.M.A.R.T., allerdings eine Festplatte die Mätzchen macht. Ich bekommen desöfteren Fehlermeldung vom Dateisystem (XFS) vorgeworfen, manche Dateien (Videos) hängen auch ganz lustig zwischendurch. Das meiste ist bereits gesichert, nur bringe ich zurzeit kein endgültiges Backup durch, da mir davor immer das Dateisystem aussteigt. Ein xfs_check lief ohne Fehlermeldung durch, weswegen ich einen Hardware-Defekt vermute. Und da liegt jetzt mein Problem, ich bin mir ehrlich gesagt nicht wirklich sicher bezüglich der Interpretation der S.M.A.R.T.-Werte:

Code:
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.7.10-gentoo-r1] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F4 EG (AFT)
Device Model:     SAMSUNG HD204UI
Serial Number:    S2H7J1CB123566
LU WWN Device Id: 5 0024e9 0049f5cc6
Firmware Version: 1AQ10001
User Capacity:    2.000.397.852.160 bytes [2,00 TB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Apr 29 13:27:22 2013 CEST

==> WARNING: Using smartmontools or hdparm with this
drive may result in data loss due to a firmware bug.
****** THIS DRIVE MAY OR MAY NOT BE AFFECTED! ******
Buggy and fixed firmware report same version number!
See the following web pages for details:
http://www.samsung.com/global/business/hdd/faqView.do?b2b_bbs_msg_id=386
http://sourceforge.net/apps/trac/smartmontools/wiki/SamsungF4EGBadBlocks

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 121)	The previous self-test completed having
					the read element of the test failed.
Total time to complete Offline 
data collection: 		(20040) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       449
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   066   020   025    Pre-fail  Always   In_the_past 10452
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       456
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1077
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       453
181 Program_Fail_Cnt_Total  0x0022   100   100   000    Old_age   Always       -       11976771
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       2
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   055   000    Old_age   Always       -       28 (Min/Max 14/45)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       4
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       141
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       486

SMART Error Log Version: 1
ATA Error Count: 68 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 68 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 1e ae e0  Error: UNC 7 sectors at LBA = 0x00ae1e88 = 11411080

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 7f 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 77 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 6f 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 67 1e ae e0 00      00:00:00.309  READ DMA

Error 67 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 df 88 1e ae e0  Error: UNC 223 sectors at LBA = 0x00ae1e88 = 11411080

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 67 1e ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1d ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1c ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1b ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1a ae e0 00      00:00:00.304  READ DMA

Error 66 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.252  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.249  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.249  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.249  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.249  READ NATIVE MAX ADDRESS EXT

Error 65 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.244  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.208  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.208  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.208  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.208  READ NATIVE MAX ADDRESS EXT

Error 64 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.203  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.203  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.203  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.203  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.203  READ NATIVE MAX ADDRESS EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed: read failure       90%      1077         11252048
# 2  Extended offline    Completed: read failure       90%      1077         11252048
# 3  Extended offline    Completed: handling damage??  90%       110         0

Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed_read_failure [90% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Neue Festplatte kaufen?

mfg benediktibk
 
von den daten die da drin stehen würde ich mir noch keine all zu großen sorgen um das laufwerk machen ... allerdings hat das gerät keinen wirklichen selbsttest gemacht ... die daten basieren nur auf dem was während des normalen betriebs gesammelt wurde ...wenn das ding ärger macht, wäre es evtl rastam mal mit exessiven tests anzufangen ...
 
Erstmal danke für die Antwort.

Inzwischen ist der SMART-Test durch (smartctl --test long):
Code:
smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.7.10-gentoo-r1] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F4 EG (AFT)
Device Model:     SAMSUNG HD204UI
Serial Number:    S2H7J1CB123566
LU WWN Device Id: 5 0024e9 0049f5cc6
Firmware Version: 1AQ10001
User Capacity:    2.000.397.852.160 bytes [2,00 TB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Apr 29 19:29:02 2013 CEST

==> WARNING: Using smartmontools or hdparm with this
drive may result in data loss due to a firmware bug.
****** THIS DRIVE MAY OR MAY NOT BE AFFECTED! ******
Buggy and fixed firmware report same version number!
See the following web pages for details:
http://www.samsung.com/global/business/hdd/faqView.do?b2b_bbs_msg_id=386
http://sourceforge.net/apps/trac/smartmontools/wiki/SamsungF4EGBadBlocks

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 121)	The previous self-test completed having
					the read element of the test failed.
Total time to complete Offline 
data collection: 		(20040) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       449
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   066   020   025    Pre-fail  Always   In_the_past 10452
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       456
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1083
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       453
181 Program_Fail_Cnt_Total  0x0022   100   100   000    Old_age   Always       -       11976783
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       2
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   061   055   000    Old_age   Always       -       39 (Min/Max 14/45)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       4
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       141
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       486

SMART Error Log Version: 1
ATA Error Count: 68 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 68 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 1e ae e0  Error: UNC 7 sectors at LBA = 0x00ae1e88 = 11411080

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 7f 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 77 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 6f 1e ae e0 00      00:00:00.309  READ DMA
  c8 00 08 67 1e ae e0 00      00:00:00.309  READ DMA

Error 67 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 df 88 1e ae e0  Error: UNC 223 sectors at LBA = 0x00ae1e88 = 11411080

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 67 1e ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1d ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1c ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1b ae e0 00      00:00:00.304  READ DMA
  c8 00 00 67 1a ae e0 00      00:00:00.304  READ DMA

Error 66 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.252  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.249  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.249  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.249  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.249  READ NATIVE MAX ADDRESS EXT

Error 65 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.244  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.208  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.208  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.208  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.208  READ NATIVE MAX ADDRESS EXT

Error 64 occurred at disk power-on lifetime: 1017 hours (42 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 07 88 fa ab e0  Error: UNC 7 sectors at LBA = 0x00abfa88 = 11270792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 87 fa ab e0 00      00:00:00.203  READ DMA
  27 00 00 00 00 00 e0 00      00:00:00.203  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:00:00.203  IDENTIFY DEVICE
  ef 03 46 00 00 00 a0 00      00:00:00.203  SET FEATURES [Set transfer mode]
  27 00 00 00 00 00 e0 00      00:00:00.203  READ NATIVE MAX ADDRESS EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: read failure       90%      1078         11252048
# 2  Short offline       Completed: read failure       90%      1077         11252048
# 3  Extended offline    Completed: read failure       90%      1077         11252048
# 4  Extended offline    Completed: handling damage??  90%       110         0

Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed_read_failure [90% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Ich werde später noch badblocks -snv darauf loslassen. Gibt es noch weitere sinnvolle Tests?

mfg benediktibk
 
badblocks hat mir 122 Fehler gemeldet, nach nur 0,29% Fortschritt. Dementsprechend mache ich mich jetzt auf die Suche nach einer neuen Platte.

Danke,
benediktibk
 
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